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Multi-Site Testing Solution

To make full use of the advanced ATE performance ,and to reduce the test time and test costs, Multi-Site probe cards comes more and more popular ,it can increase the test efficiency and helpful for test cost reduction.

Now SSTS® could make

Diagonal: 1x4,1x8,1x16

Shelf:1x2,2x2,up to 1x12 in- line

Multi-die, Memory/CIS Device, 32DUT, 64DUT,128 DUT,256DUT,etc.