Contact
Suzhou Silicon Test System Co., Ltd.
Add: 3F, Building 3, No. 38 Dongfu Road, Suzhou Industrial Park, Jiangsu, PR China
Zip: 215123
Contact: James Zhang
Tel: (86)512 6293 1598 Ext.866
Mobile: (86)186 6261 1766
Fax: (86)512 62931601
E-mail: James@sststech.com
Website: www.sststech.com
Products
Fine Pitch Probe Card

Fine Pitch Probe Card
≤30μm in-line
≤30x60μm 2 row stagger
≤40x80μm 3 or 4 row stagger
≤50x50μm pad size

Multi-DUT Probe Card

Multi-DUT Probe Card
Multi-DUT cantilever probe card is applied to a variety of chip test,i.e. Memory,Logic,Analog,Digital and others.

LCD Driver Device Test Probe Card

LCD Driver Device Test Probe Card
LDI (LCD Driver IC) Probe Card is applied to LCD driver IC chip test and final test.

Image Sensor Device Test Probe Card

Image Sensor Device Test Probe Card
I-S (Image Sensor) probe card is applied to image sensor device test with high performance.

Vertical Type Probe Card

Vertical Type Probe Card
SSTS offers advanced vertical probe card,to meet vertical test requests from some customers.

Blade Type Probe Card

Blade Type Probe Card
SSTS provides various blade type probe cards,including ceramic,metal material etc.

Specialized Probe Card

Specialized Probe Card
1. High Frequency Probe Card
2. WAT/PCM Wafer Test Probe Card
3. High-Voltage & Current Test Probe Card

About Us

Suzhou Silicon Test System Co., Ltd. ("SSTS") was founded in 2009, located in Suzhou Industrial Park of China. The company is specialized in the R&D.manufacture and service of high performance probing interface products and test systems in the semiconductor industry and other testing facility. As one of the fastest growing test solution providers, SSTS team always