Probe card

Cantilever Type

Specialized Probe Card

 

 

 

 

 

1. High Frequency Probe Card

SSTS TM Hi-F Probe Card is applied to the device with high frequency test, the frequency range is optional and the max frequency can reach to 10G.

 

2. WAT/PCM Wafer Test Probe Card

SSTS TM WAT/PCM Probe Card is applied to the wafer parametric test, it can be controlled around 1 pA/V.

 

3. High-Voltage & Current Test Probe Card

SSTS TM Hi-VC Probe card is applied to the device with high voltage, current and power, it can meet max 1KV and/or 10A as request.