| Solution: | Cantilever |
| Product: | Shelf Probe Card |
| Device: | SSTS-F-001 |
| Probe Material: | Rew,NC probe |
| DUTS: | Shelf 2X2 |
| Work Temperature: | (-45 ~ 185)℃ |
Suzhou Silicon Test System Co., Ltd.
3F, Building 3, No. 38 Dongfu Road, Suzhou Industrial Park, Jiangsu, PR China
James@sststech.com
86-512-62931598-865
No. 32059002004828