| Solution: | Cantilever |
| Product: | WAT Probe Card |
| Device: | SSTS-W-001 |
| Probe Material: | Rew |
| DUTS: | 24 |
| Min . Pitch: | 100um |
| MAX . Speed: | 3GBps |
| Work Temperature: | 125℃ |
Suzhou Silicon Test System Co., Ltd.
3F, Building 3, No. 38 Dongfu Road, Suzhou Industrial Park, Jiangsu, PR China
James@sststech.com
86-512-62931598-865
No. 32059002004828